Articolo in rivista, 2010, ENG, 10.1117/12.861543
Kim K. H.; Bolotnikov A. E.; Camarda G. S.; Marchini L.; Yang G.; Hossain A.; Cui Y.; Xu L.; James R. B.
Brookhaven Natl Lab, Upton, NY, USA, CNR-IMEM, Parma, Brookhaven Natl Lab, Upton, NY, USA and Northwestern Polytechnical University, Xi'an, Shaanxi, China
Dark currents, including those in the surface and bulk, are the leading source of electronic noise in X-ray and gamma detectors, and are responsible for degrading a detector's energy resolution. The detector material itself determines the bulk leakage current; however, the surface leakage current is controllable by depositing appropriate passivation layers. In previous research, we demonstrated the effectiveness of surface passivation in CZT (CdZnTe) and CMT (CdMnTe) materials using ammonium sulfide and ammonium fluoride. In this research, we measured the effect of such passivation on the surface states of these materials, and on the performances of detectors made from them.
Proceedings of SPIE, the International Society for Optical Engineering 7805 , pp. 78051Uā?
Passivation, CdZnTe, CdMnTe, ammonium sulfide, leakage current
IMEM ā Istituto dei materiali per l'elettronica ed il magnetismo
CNR authors
External links
OAI-PMH: Dublin Core
OAI-PMH: Mods
OAI-PMH: RDF
DOI: 10.1117/12.861543
URL: http://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=722627
External IDs
CNR OAI-PMH: oai:it.cnr:prodotti:32940
DOI: 10.1117/12.861543
ISI Web of Science (WOS): 000285827000038