Contributo in atti di convegno, 2019, ENG
Cremona A.; Giunta A.; O'Mullane M.; Causa F.; Ghezzi F.; Granucci G.; Mellera V.; Minelli D.; Nardone A.; Pedroni M.; Ricci D.; Rispoli N.; Uccello A.; Vassallo E.
Institute for Plasma Science and Technology, National Research Council of Italy, Milan, Italy; RAL Space, STFC, Rutherford Appleton Laboratory, Harwell Oxford, Didcot, UK; Department of Physics, University of Strathclyde, Glasgow, UK.
The electron temperature (Te) and electron density (ne) are important parameters for characterizing the plasma status in the Scrape-Off-Layer (SOL) and the divertor of magnetically confined fusion devices and investigating its physical and chemical properties in different operating conditions [1]. These parameters are usually derived locally using Langmuir Probes (LP), which are intrusive techniques. Optical diagnostics, such as Optical Emission Spectroscopy (OES), utilizing plasma radiation, offer a non-invasive complementary technique providing extremely powerful insights when supported by an accurate atomic modelling [2, 3]. This work focuses on the implementation of the OES technique to analyze an argon plasma in the linear device GyM and to derive an estimate of the line-of-sight averaged Te and ne.
46th EPS Conference on Plasma Physics, pp. 1–4, Milano - Italy, 8 - 12 July 2019
Spectroscopic diagnostics, electron temperature, electron density, Argon plasma, GyM
Uccello Andrea, Pedroni Matteo, Vassallo Espedito, Nardone Antonio, Ghezzi Francesco Mauro, Granucci Gustavo, Rispoli Natale, Cremona Anna, Mellera Vittoria Antonia, Ricci Daria, Causa Federica, Minelli Daniele
IFP – Istituto di fisica del plasma "Piero Caldirola", ISTP – Istituto per la Scienza e Tecnologia dei Plasmi
ID: 405135
Year: 2019
Type: Contributo in atti di convegno
Creation: 2019-08-01 09:58:35.000
Last update: 2023-02-07 16:04:26.000
External IDs
CNR OAI-PMH: oai:it.cnr:prodotti:405135
Scopus: 2-s2.0-85084022447