Articolo in rivista, 2022, ENG, 10.1039/d2cp03441g
Davì R.; Carraro G.; Stojkovska M.; Smerieri M.; Savio L.; Gallet J.J.; Bournel de F.; Rocca M.; Vattuone L.
DCCI, Universita` degli Studi di Genova, Via Dodecaneso 31, 16146 Genova, Italy; DIFI, Universita` degli Studi di Genova, Via Dodecaneso 33, 16146 Genova, Italy; IMEM-CNR, UOS di Genova, Via Dodecaneso 33, 16146 Genova, Italy; Sorbonne Universite´, CNRS, Laboratoire de Chimie Physique Matie`re et Rayonnement, UMR 7614, Campus Pierre et Marie Curie, 4 Place Jussieu, 75252 Paris Cedex 05, France; Synchrotron SOLEIL, L'Orme des Merisiers, Saint-Aubin, F-91192 Gif-sur-Yvette, France
We use synchrotron radiation-induced core level photoemission spectroscopy to investigate the influence of vacancies, produced by ion bombardment, on monolayer raphene/Ni(111) exposed to CO at pressures ranging from ultra-high vacuum (1010 mbar) up to near ambient (5.6 mbar) conditions. CO intercalates at a rate which is comparable to the one observed in absence of defects and reacts via the Boudouard reaction producing additional carbon atoms and CO2. While the former attach to the graphene layer and extend it over areas previously covered by carbide, the CO2 molecules bind to the graphene vacancies forming epoxy-like bonds across them, thus mending the defects. The soformed complexes give rise to a peak at 533.4 eV which persists upon evacuating the vacuum chamber at room temperature and which we assign to a covalently bonded species containing C and O.
PCCP. Physical chemistry chemical physics (Print) 24 , pp. 28486-1–28486-9
Graphene, reaction under cover, defect
Rocca Mario Agostino, Vattuone Luca, Dav Rocco, Stojkovska Marija, Savio Letizia, Smerieri Marco, Carraro Giovanni
IMEM – Istituto dei materiali per l'elettronica ed il magnetismo
ID: 490067
Year: 2022
Type: Articolo in rivista
Creation: 2023-12-15 17:38:52.000
Last update: 2024-01-09 10:09:42.000
External links
OAI-PMH: Dublin Core
OAI-PMH: Mods
OAI-PMH: RDF
DOI: 10.1039/d2cp03441g
URL: https://pubs.rsc.org/en/content/articlelanding/2022/cp/d2cp03441g
External IDs
CNR OAI-PMH: oai:it.cnr:prodotti:490067
DOI: 10.1039/d2cp03441g
ISI Web of Science (WOS): 000888599900001