Articolo in rivista, 2010, ENG, 10.1889/JSID18.11.896

Studying nematic liquid crystals by spectroscopic ellipsometry

Tkachenko, V; Marino, A; Abbate, G

CNR-SPIN and Dipartimento di Scienze Fisiche, University of Naples Federico II,

The optical characterization of liquid crystals, in a wide spectral range, is becoming a very important technical task because of their expanding applications in displays, optical telecommunications and other advanced areas of science and engineering. One of the most versatile, sensitive, and well-established technique for the optical characterization of solid and liquid materials is spectroscopic ellipsometry. In this paper, an outline is presented on the use of ellipsometry for nematic liquid-crystal characterization: anisotropic refractive-indices measurements and their temperature dependence, anchoring energy, and tilt distribution inside cells will be discussed. The paper is an extended version of a previously published paper.

Journal of the Society for Information Display 18 (11), pp. 896–903

Keywords

Spectroscopic ellipsometry;liquid crystals;refractive index;tilt angle;anchoring energy

CNR authors

Abbate Giancarlo, Marino Antigone, Tkachenko Volodymyr

CNR institutes

SPIN – Istituto superconduttori, materiali innovativi e dispositivi