Articolo in rivista, 2010, ENG, 10.1109/NSSMIC.2010.5874498

Crystal Defects and Charge Collection in CZT X-Ray and Gamma Detectors

Marchini L.; Zappettini A.; Zha M.; Zambelli N.; Bolotnikov A.; Camarda G.; James R. B.

CNR-IMEM, Parma, Brookhaven Natl Lab, Upton, NY, USA

Cadmium Zinc Telluride (CZT) is one of the most exploited materials for x-ray and gamma ray radiation detection. Nevertheless CZT ingots are still affected by many defects, the most common features are Te inclusions, dislocations and grain boundaries. In this work the results of many investigation techniques are put together and compared in order to have a better understanding of the role of each defect in the degradation of the detector performances. A CZT ingot grown by low pressure Bridgman technique in IMEM Institute, Parma, was analyzed. The material was studied by means of the IR microscopy, for the identification of Te inclusions and then studied with the use of the synchrotron light source (NSLS National Synchrotron Light Source) for the analysis of the crystalline structure and uniformity of the x-ray response.

IEEE conference record - Nuclear Science Symposium & Medical Imaging Conference. , pp. 3674–3677

Keywords

CdZnTe, X-ray detectors

CNR authors

Marchini Laura, Zambelli Nicola, Zha Mingzheng, Zappettini Andrea

CNR institutes

IMEM – Istituto dei materiali per l'elettronica ed il magnetismo