Articolo in rivista, 2011, ENG, 10.1103/PhysRevLett.107.156802

Tunable Hot-Electron Transfer Within a Single Core-Shell Nanowire

G. Chen, E.M. Gallo, O.D. Leaffer, T. McGuckin, Terrence, P. Prete, N. Lovergine, J.E. Spanier

Drexel Univ, Dept Mat Sci & Engn, Philadelphia, PA 19104 USA CNR, IMM, Lecce, Italy Univ Salento, Dept Innovat Engn, Lecce, Italy

We report the hot photoexcited electron transfer across the coaxial interface of a cylindrical core-shell nanowire. Modulation of the transfer rates, manifested as a large tunability of the voltage onset of negative differential resistance and of voltage-current phase, is achieved using three different modes. The coupling of electrostatic gating, incident photon energy, and the incident photon intensity to transfer rates is facilitated by the combined influences of geometric confinement and heterojunction shape on hot-electron transfer, and by electron-electron scattering rates that can be altered by varying the incident photon flux, with evidence of weak electron-phonon scattering. Dynamic manipulation of this transfer rate permits the introduction and control of a continuously adjustable phase delay of up to about 130 within a single nanometer-scale device element.

Physical review letters (Print) 107 (15), pp. 156802-1–156802-5

Keywords

Core-Shell Nanowires, Hot-Electron Transfer, FIELD-EFFECT TRANSISTORS, REAL-SPACE TRANSFER, devices

CNR authors

Prete Paola

CNR institutes

IMM – Istituto per la microelettronica e microsistemi