Articolo in rivista, 2012, ENG, 10.1038/nmat3450

Bulk electronic structure of the dilute magnetic semiconductor Ga 1-x Mn x As through hard X-ray angle-resolved photoemission

Gray, Alexander X.; Minár, Ján; Ueda, Shigenori; Stone, Peter R.; Yamashita, Yoshiyuki; Fujii, Jun; Braun, Jürgen W.; Pluci?ski, ?ukasz; Schneider, Claus Michael; Panaccione, Giancarlo C.; Ebert, Hubert; Dubón, Oscar D.; Kobayashi, Keisuke; Fadley, Charles S.

UC Davis; Lawrence Berkeley National Laboratory; Stanford University; Ludwig-Maximilians-Universitat Munchen; National Institute for Materials Science Tsukuba; UC Berkeley; Laboratorio Nazionale TASC; Forschungszentrum Jülich (FZJ)

A detailed understanding of the origin of the magnetism in dilute magnetic semiconductors is crucial to their development for applications. Using hard X-ray angle-resolved photoemission (HARPES) at 3.2â EUR?keV, we investigate the bulk electronic structure of the prototypical dilute magnetic semiconductor Ga 0.97 Mn 0.03 As, and the reference undoped GaAs. The data are compared to theory based on the coherent potential approximation and fully relativistic one-step-model photoemission calculations including matrix-element effects. Distinct differences are found between angle-resolved, as well as angle-integrated, valence spectra of Ga 0.97 Mn 0.03 As and GaAs, and these are in good agreement with theory. Direct observation of Mn-induced states between the GaAs valence-band maximum and the Fermi level, centred about 400â EUR?meV below this level, as well as changes throughout the full valence-level energy range, indicates that ferromagnetism in Ga 1-x Mn x As must be considered to arise from both p-d exchange and double exchange, thus providing a more unifying picture of this controversial material. © 2012 Macmillan Publishers Limited. All rights reserved.

Nature materials (Print) 11 (11), pp. 957–962

Keywords

PHOTOELECTRON-SPECTROSCOPY; CURIE-TEMPERATURE; VALENCE-BAND; (GA, MN)AS

CNR authors

Panaccione Giancarlo, Fujii Jun

CNR institutes

IOM – Istituto officina dei materiali

ID: 315020

Year: 2012

Type: Articolo in rivista

Creation: 2015-02-20 14:12:42.000

Last update: 2016-03-03 17:08:12.000

External IDs

CNR OAI-PMH: oai:it.cnr:prodotti:315020

DOI: 10.1038/nmat3450

Scopus: 2-s2.0-84867860177

ISI Web of Science (WOS): WOS:000310434600020